Semiconductivities of passive films formed on stainless steel bend under erosion-corrosion conditions

被引：88
作者：
Zeng, L. [1 ]
Guo, X. P. [2 ]
Zhang, G. A. [2 ]
Chen, H. X. [1 ]
机构：
[1] Wuhan Inst Technol, Sch Mech & Elect Engn, Wuhan 430205, Hubei, Peoples R China
[2] Huazhong Univ Sci & Technol, Key Lab Mat Chem Energy Convers & Storage, Hubei Key Lab Mat Chem & Serv Failure, Sch Chem & Chem Engn,Minist Educ, Wuhan 430074, Hubei, Peoples R China
来源：
CORROSION SCIENCE | 2018年 / 144卷
基金：
中国国家自然科学基金;
关键词：
Stainless steel; Erosion; XPS; Passive films; BORATE BUFFER SOLUTION; MOTT-SCHOTTKY ANALYSIS; POINT-DEFECT MODEL; CARBON-STEEL; ELECTROCHEMICAL CHARACTERIZATION; DIFFERENT LOCATIONS; ALLOYS; ELBOW; IRON; RESISTANCE;
D O I：
10.1016/j.corsci.2018.08.045
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Semiconductivities of passive films at a stainless steel bend in sand-containing NaCl solution under erosion corrosion (E-C) conditions were investigated by Mott-Schottky analysis. It is demonstrated that higher donor densities and faster diffusivities of point defects within passive film appear at the extrados of the bend. X-ray photoelectron spectroscopy (XPS) analysis reveals that the passive layer at the extrados of bend contains less Fe3O4 and Fe2O3. The semiconductivities of passive films are strongly dependent on the hydrodynamic characteristics at the bend.
引用
收藏
页码：258 / 265
页数：8
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