Confocal two photon emission microscopy: A new approach to waveguide imaging

被引:12
作者
Dierolf, V [1 ]
Sandmann, C [1 ]
机构
[1] Lehigh Univ, Dept Phys, Bethlehem, PA 18015 USA
关键词
confocal microscopy; site selective spectroscopy; Er3+; LiNbO3; integrated optics; waveguides;
D O I
10.1016/S0022-2313(02)00491-X
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Based on earlier studies of the interaction effects between Er3+ and Ti4+ ions in Ti : LiNbO3 waveguides we investigated the feasibility of using the Er3+ as a sensitive probe to determine Ti4+-diffusion profiles with high spatial resolution. Using a home-built confocal microscope combined with site-elective optical spectroscopy we tested two different operation modes: (i) Evaluating the emission spectra obtained by one-step excitation with a single laser we obtain high resolution (approximate to 700 nm) Ti4+-concentration images. In particular using the second moments of the spectra, which turn out to be approximately linearly related to the Ti4+-concentration, we obtain very good contrast with essentially no artifacts caused by topology, intensity fluctuations, and Er3+ ion concentration profile. (ii) Measuring the total emission intensity under a specially chosen two step excitation scheme allows to selectively excite regions with a certain Ti4+ concentration. While for (i) a calibration can be done, for (ii) this will be hard due to the multi-site character of the Er3+ in LiNbO3. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:201 / 205
页数:5
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