Influence of temperature during phosphorus emitter diffusion from a spray-on source in multicrystalline silicon solar cell processing

被引:15
作者
Bentzen, A.
Schubert, G.
Christensen, J. S.
Svensson, B. G.
Holt, A.
机构
[1] Inst Energy Technol, Sect Renewable Energy, NO-2027 Kjeller, Norway
[2] Univ Konstanz, Dept Phys, D-78457 Constance, Germany
[3] Univ Oslo, Ctr Mat Sci & Nanotechnol, Dept Phys, N-0316 Oslo, Norway
来源
PROGRESS IN PHOTOVOLTAICS | 2007年 / 15卷 / 04期
关键词
multicrystalline silicon; phosphorus diffusion; gettering; contact formation; screen-printing; solar cell processing;
D O I
10.1002/pip.731
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We have investigated the influence of diffusion temperature during phosphorus emitter diffusion from a spray-on source on the performance of screen-printed multi-crystalline silicon solar cells. Because of the dual diffusion mechanism present at high concentration in-diffusion of phosphorus in silicon, applying lower diffusion temperatures for a longer duration results in significantly enhanced penetration of the low concentration tail relative to the high concentration region. Moreover, we show that the sheet resistance of in-diffused emitters from a high concentration source depends primarily on the extension of the high concentration region, thus significantly different emitter profiles can be manufactured without altering the sheet resistance considerably. Because of the enhanced tail penetration, emitters Of a specified sheet resistance diffused at reduced temperatures can result in higher fill factors of screen-printed solar cells due to diminution of Schottky type shunts. Furthermore, emitters diffused at lower temperatures for longer durations can yield a higher gettering efficiency, resulting in increased bulk recombination lifetime, and thus a higher internal quantum efficiency at long wavelengths. The deeper tail extension of low temperature emitters, however, causes increased absorption within the highly recombinative emitter, resulting in current losses due to a lower internal quantum efficiency at short wavelengths. Copyright (c) 2006 John Wiley & Sons, Ltd.
引用
收藏
页码:281 / 289
页数:9
相关论文
共 24 条
[1]   High concentration in-diffusion of phosphorus in Si from a spray-on source [J].
Bentzen, A ;
Holt, A ;
Christensen, JS ;
Svensson, BG .
JOURNAL OF APPLIED PHYSICS, 2006, 99 (06)
[2]   Correspondence between sheet resistance and emitter profile of phoshorus diffused emitters from a spray-on dopant [J].
Bentzen, A ;
Holt, A .
Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference - 2005, 2005, :1153-1156
[3]   Recombination lifetime and trap density variations in multicrystalline silicon wafers through the block [J].
Bentzen, A ;
Tathgar, H ;
Kopecek, R ;
Sinton, R ;
Holt, A .
Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference - 2005, 2005, :1074-1077
[4]  
BENTZEN A, IN PRESS J SOLAR ENE, DOI DOI 10.1016/J.SOLMAT.2006.06.020
[5]  
BENTZEN A, 2005, TECH DIG 14 INT PHOT, P405
[6]  
Bentzen A., 2004, P 19 EUR PHOT SOL EN, P935
[7]   High minority carrier lifetime in phosphorus-gettered multicrystalline silicon [J].
Cuevas, A ;
Stocks, M ;
Armand, S ;
Stuckings, M ;
Blakers, A ;
Ferrazza, F .
APPLIED PHYSICS LETTERS, 1997, 70 (08) :1017-1019
[8]   QUANTITATIVE MODEL FOR DIFFUSION OF PHOSPHORUS IN SILICON AND EMITTER DIP EFFECT [J].
FAIR, RB ;
TSAI, JCC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (07) :1107-1118
[9]   Scanning IQE-measurement for accurate current determination on very large area solar cells [J].
Fischer, B ;
Keil, M ;
Fath, P ;
Bucher, E .
CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002, 2002, :454-457