Microstructural, Magnetic Anisotropy, and Magnetic Domain Structure Correlations in Epitaxial FePd Thin Films With Perpendicular Magnetic Anisotropy

被引：27
|
作者：
Skuza, J. R. [1 ]
Clavero, C. [2 ]
Yang, K. [2 ]
Wincheski, B. [3 ]
Lukaszew, R. A. [1 ,2 ]
机构：
[1] Coll William & Mary, Dept Phys, Williamsburg, VA 23187 USA
[2] Coll William & Mary, Dept Appl Sci, Williamsburg, VA 23187 USA
[3] NASA, Nondestruct Evaluat Sci Branch, Langley Res Ctr, Hampton, VA 23681 USA
来源：
IEEE TRANSACTIONS ON MAGNETICS | 2010年 / 46卷 / 06期
基金：
美国国家科学基金会;
关键词：
Magnetic domains; perpendicular magnetic anisotropy (PMA); perpendicular magnetic recording; thin films; CHEMICAL ORDER; STRAIN RELAXATION; LAYER THICKNESS; GROWTH;
D O I：
10.1109/TMAG.2009.2039923
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
L1(0) order was optimized in FePd epitaxial thin films prepared using dc magnetron sputter deposition on MgO(001) substrates by investigating various growth temperatures. A series of films was grown at the optimal temperature with varying thickness and degree of chemical order to investigate the interplay between the microstructure, magnetic anisotropy, and magnetic domain structure. The experimentally measured magnetic domain size/period and magnetic anisotropy in this high perpendicular anisotropy system were found to be correlated following the analytical energy model proposed by Kooy and Enz that considers a delicate balance between the domain wall energy and the demagnetizing stray field energy.
引用
收藏
页码：1886 / 1889
页数：4
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