An ARXPS and ERXPS study of quaternary ammonium and phosphonium ionic liquids: utilising a high energy Ag Lα′ X-ray source

被引：11
作者：
Blundell, Rebecca K. [1 ]
Delorme, Astrid E. [1 ]
Smith, Emily F. [1 ]
Licence, Peter [1 ]
机构：
[1] Univ Nottingham, Sch Chem, GlaxoSmithKline Carbon Neutral Lab, Nottingham NG7 2RD, England
来源：
PHYSICAL CHEMISTRY CHEMICAL PHYSICS | 2016年 / 18卷 / 08期
基金：
英国工程与自然科学研究理事会;
关键词：
CATION-ANION INTERACTIONS; OUTER ATOMIC SURFACE; PHOTOELECTRON-SPECTROSCOPY; ELECTRON-SPECTROSCOPY; SUBSTITUENTS; INTERFACE; IMPACT; LAYER; MIES; XPS;
D O I：
10.1039/c5cp07089a
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A series of ammonium-and phosphonium-based ionic liquids have been probed using X-ray photoelectron spectroscopy (XPS) with a high energy Ag L alpha' X-ray source. The capability of the Ag L alpha' X-ray source for ionic liquid analysis is confirmed alongside the characterisation of previously undetected high energy core photoelectron emissions. Additionally, the utilisation of the Ag L alpha' X-ray source as a depth profiling technique (ERXPS) to investigate the structure of the ionic liquid/vacuum interface has been demonstrated, with comparison made to angle resolved X-ray photoelectron spectroscopy (ARXPS).
引用
收藏
页码：6122 / 6131
页数：10
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