Effect of annealing temperature on dielectric and pyroelectric property of highly (111)-oriented (Pb0.98La0.02)(Zr0.95Ti0.05)0.995O3 thin films

被引：4
作者：
Zhang, Tian-Fu [1 ]
Tang, Xin-Gui [1 ]
Liu, Qiu-Xiang [1 ]
Jiang, Yan-Ping [1 ]
Xiong, De-Ping [1 ]
Feng, Zu-Yong [1 ]
Cheng, Tie-Dong [1 ]
机构：
[1] Guangdong Univ Technol, Sch Phys & Optoelect Engn, Guangzhou Higher Educ Mega Ctr, Guangzhou 510006, Guangdong, Peoples R China
来源：
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | 2015年 / 26卷 / 03期
基金：
中国国家自然科学基金;
关键词：
FERROELECTRIC PROPERTIES; ELECTRICAL-PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY; OPTICAL-PROPERTIES; GLASS SUBSTRATE; CERAMICS; TRANSITION; DEPOSITION; FIELD;
D O I：
10.1007/s10854-014-2610-y
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Highly (111)-oriented lanthanum modified lead zirconate titanate (Pb0.98La0.02)(Zr0.95Ti0.05)(0.995)O-3 thin films with the thickness of 300 nm were fabricated by a sol-gel method. Electrical measurements were conducted on (Pb0.98La0.02)(Zr0.95Ti0.05)(0.995)O-3 thin films. Well-saturated hysteresis loops were achieved with an applied voltage of 19 V. Dielectric constant and dielectric loss as a function of frequency for (Pb0.98La0.02)(Zr0.95Ti0.05)(0.995)O-3 thin films annealed at 670 degrees C were measured. Dc bias field dependence of dielectric constant and dielectric loss were conducted at room temperature; the dielectric tunability of (Pb0.98La0.02)(Zr0.95Ti0.05)(0.995)O-3 thin film annealed at 670 degrees C was 20.3 %. The pyroelectric coefficient of films was measured by a dynamic technique. The pyroelectric coefficients of (Pb0.98La0.02)(Zr0.95Ti0.05)(0.995)O-3 thin films annealed at 570, 620 and 670 degrees C were 208, 244 and 192 mu C/m(2) K, respectively. It was found that the pyroelectric property was highly depended on the annealing temperature.
引用
收藏
页码：1784 / 1788
页数：5
相关论文
共 31 条
  • [1] Phase transition current of antiferroelectric (Pb0.97La0.02)(Zr0.95Ti0.05)O3 thick films under thermo-electric coupled field
    An, Kun
    Li, Peiqing
    Chen, Donghong
    Chou, Xiujian
    Xue, Chenyang
    Liu, Jun
    Zhang, Wendong
    [J]. SOLID STATE COMMUNICATIONS, 2014, 180 : 64 - 67
  • [2] TEMPERATURE-TIME TEXTURE TRANSITION OF PB(ZR1-XTIX)O-3 THIN-FILMS .1. ROLE OF PB-RICH INTERMEDIATE PHASES
    CHEN, SY
    CHEN, IW
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1994, 77 (09) : 2332 - 2336
  • [3] Ferroelectric and Piezoelectric properties of (111) oriented lanthanum modified lead zirconate titanate film
    Dutta, Soma
    Jeyaseelan, A. Antony
    Sruthi, S.
    [J]. THIN SOLID FILMS, 2014, 562 : 190 - 194
  • [4] Ferroelectric properties of Ba0.6Sr0.4TiO3 thin films with different grain sizes
    Fu, CL
    Yang, CR
    Chen, HW
    Hu, LY
    Wang, YX
    [J]. MATERIALS LETTERS, 2005, 59 (2-3) : 330 - 333
  • [5] Effects of superimposed electric field and porosity on the hydrostatic pressure-induced rhombohedral to orthorhombic martensitic phase transformation in PZT 95/5 ceramics
    Hall, D. A.
    Evans, J. D. S.
    Covey-Crump, S. J.
    Holloway, R. F.
    Oliver, E. C.
    Mori, T.
    Withers, P. J.
    [J]. ACTA MATERIALIA, 2010, 58 (20) : 6584 - 6591
  • [6] Electrical properties of Pb0.97La0.02(Zr0.95Ti0.05)O3 antiferroelectric thin films on TiO2 buffer
    Hao, Xihong
    Zhai, Jiwei
    Yao, Xi
    [J]. MATERIALS RESEARCH BULLETIN, 2008, 43 (04) : 1038 - 1045
  • [7] Composition-dependent dielectric and energy-storage properties of (Pb,La)(Zr,Sn,Ti)O3 antiferroelectric thick films
    Hao, Xihong
    Wang, Ying
    Zhang, Le
    Zhang, Liwen
    An, Shengli
    [J]. APPLIED PHYSICS LETTERS, 2013, 102 (16)
  • [8] Surface morphology and ferroelectric properties of compositional gradient PZT thin films prepared by chemical solution deposition process
    He, Gang
    Zhang, Yao
    Peng, Chao
    Li, Xiaomeng
    [J]. APPLIED SURFACE SCIENCE, 2013, 283 : 532 - 536
  • [9] Double hysteresis loops induced by Mn doping in Pb0.99Nb0.02(Zr0.95Ti0.05)0.98O3 ferroelectric ceramics
    Jiang, Meng
    Li, Xuhai
    Zhu, Jiliang
    Zhu, Xiaohong
    Shi, Wei
    Li, Lihua
    Xiao, Dingquan
    Zhu, Jianguo
    [J]. CURRENT APPLIED PHYSICS, 2010, 10 (02) : 526 - 530
  • [10] Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region
    Jiang, Y. P.
    Tang, X. G.
    Liu, Q. X.
    Li, Q.
    Ding, A. L.
    [J]. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2007, 137 (1-3): : 304 - 309
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