Comment on "Point of zero charge of a corundum-water interface probed with optical second harmonic generation (SHG) and atomic force microscopy (AFM): New approaches to oxide surface charge" by A. G. Stack, S. R. Higgins, and C. M. Eggleston

被引：11

作者：

Kosmulski, M ^{[1
]}

机构：

[1] Tech Univ Lublin, Dept Electrochem, PL-20618 Lublin, Poland

来源：

GEOCHIMICA ET COSMOCHIMICA ACTA | 2003年 / 67卷 / 02期

关键词：

D O I：

10.1016/S0016-7037(02)01034-7

中图分类号：

P3 [地球物理学]; P59 [地球化学];

学科分类号：

0708 ; 070902 ;

摘要：

引用

页码：319 / 320

页数：2

共 10 条

[1] THE ADSORPTION OF SOLUBLE SILICA AT SOLID-AQUEOUS SOLUTION INTERFACES .1. LEACHING FROM GLASS - AN ELECTROKINETIC STUDY [J].

FURLONG, DN ;

FREEMAN, PA ;

LAU, ACM .

JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1981, 80 (01) :20-31

[2] MULTISITE PROTON ADSORPTION MODELING AT THE SOLID-SOLUTION INTERFACE OF (HYDR)OXIDES - A NEW APPROACH .1. MODEL DESCRIPTION AND EVALUATION OF INTRINSIC REACTION CONSTANTS [J].

HIEMSTRA, T ;

VANRIEMSDIJK, WH ;

BOLT, GH .

JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1989, 133 (01) :91-104

[3] MULTISITE PROTON ADSORPTION MODELING AT THE SOLID-SOLUTION INTERFACE OF (HYDR)OXIDES - A NEW APPROACH .2. APPLICATION TO VARIOUS IMPORTANT (HYDR)OXIDES [J].

HIEMSTRA, T ;

DEWIT, JCM ;

VANRIEMSDIJK, WH .

JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1989, 133 (01) :105-117

[4] Attempt to determine pristine points of zero charge of Nb2O5, Ta2O5, and HfO2 [J].

Kosmulski, M .

LANGMUIR, 1997, 13 (23) :6315-6320

[5] Direct force measurements between silica and alumina [J].

Larson, I ;

Drummond, CJ ;

Chan, DYC ;

Grieser, F .

LANGMUIR, 1997, 13 (07) :2109-2112

[6] SURFACE-CHARGE AND INTERACTION WITH SULFATE-IONS AT THE BOEHMITIZED ALUMINUM [J].

LOVRECEK, B ;

BOLANCA, Z ;

KORELIC, O .

SURFACE & COATINGS TECHNOLOGY, 1987, 31 (04) :351-364

[7]

Lyklema J., 1995, FUNDAMENTALS INTERFA, VII

[8]

MOYA JS, 1980, CERAMIC B, V59, P1198

[9] Point of zero charge of a corundum-water interface probed with optical Second Harmonic Generation (SHG) and Atomic Force Microscopy (AFM): New approaches to oxide surface charge [J].

Stack, AG ;

Higgins, SR ;

Eggleston, CM .

GEOCHIMICA ET COSMOCHIMICA ACTA, 2001, 65 (18) :3055-3063

[10] Measurement of interaction forces between silica and alpha-alumina by atomic force microscopy [J].

Veeramasuneni, S ;

Yalamanchili, MR ;

Miller, JD .

JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1996, 184 (02) :594-600

← 1 →