Metrological timelines in traceability

被引:4
作者
Ehrlich, CD [1 ]
Rasberry, SD [1 ]
机构
[1] NIST, Technol Serv, Gaithersburg, MD 20899 USA
关键词
D O I
10.1088/0026-1394/34/6/6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
There is a growing requirement for an internationally accepted system of recognition of measurement capabilities and relationships within and among countries, to facilitate seamless global commerce and trade. As a result, metrologists world-wide have recently developed increased interest in the concept and definition of traceability. Classically, traceability provides a way of relating the results of a measurement (or value of a standard) to higher-level standards. Such standards are usually national or international standards, and the comparisons used to provide the traceability must have well-understood uncertainties. An additional complexity arises because all instruments and standards are subject to change, however slight, over time. This paper develops approaches for dealing with the effects of such time-dependent changes as a part of traceability statements. The use of metrological timelines provides a means of effectively visualizing these relationships in a statement of traceability. When the rate of change in the measurement process is sufficiently small, the approach proposed here is less important. However, documented measurement assurance procedures are required at all levels so that appropriate uncertainties may be estimated with confidence. When laboratory or national boundaries are crossed in the traceability process, other factors come into play, and the original concept of traceability can become obscure. It is becoming common to hear the term "equivalence" used to describe these more complex measurement relationships.
引用
收藏
页码:503 / 514
页数:12
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