Czochralski (CZ) and float-zone (FZ) crystals were grown from experimental solar-grade silicon (SoG-Si) feedstock materials developed by Crystal Systems. The materials were metallurgical-grade Si and highly boron-doped p-type electronic-grade Si (EG-Si) reject material, both of which were gaseous melt-treated to remove boron. Crystal growth observations, lifetime and impurity characterization of the grown crystals, and device performance of wafers from them are presented. Devices made directly on treated high-B EG-Si feedstock have a little over half the efficiency of devices made from control CZ samples. However, devices on CZ and FZ crystals grown from the treated high-B EG-Si feedstock have comparable PV performance (14.0% and 13.8% efficiency, respectively) to that of CZ control samples (14.1%).