Optical range finder using semiconductor laser frequency noise
被引:1
作者:
Saito, T.
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Niigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Saito, T.
[1
]
Kondo, K.
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Niigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Kondo, K.
[1
]
Tokutake, Y.
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Niigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Tokutake, Y.
[1
]
Maehara, S.
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Niigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Maehara, S.
[1
]
Doi, K.
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Univ Tokyo, Inst Cosm Ray Res, Kashiwa, Chiba 2778582, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Doi, K.
[3
]
Arai, H.
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Niigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Arai, H.
[1
]
Sato, T.
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Niigata Univ, Fac Engn, Nishi Ku, Niigata 9502181, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Sato, T.
[2
]
Ohkawa, M.
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Niigata Univ, Fac Engn, Nishi Ku, Niigata 9502181, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Ohkawa, M.
[2
]
Ohdaira, Y.
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Niigata Univ, Fac Engn, Nishi Ku, Niigata 9502181, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Ohdaira, Y.
[2
]
Sakamoto, S.
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Niigata Univ, Fac Engn, Nishi Ku, Niigata 9502181, JapanNiigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
Sakamoto, S.
[2
]
机构:
[1] Niigata Univ, Grad Sch Sci & Technol, Sato Lab, Nishi Ku, Niigata 9502181, Japan
[2] Niigata Univ, Fac Engn, Nishi Ku, Niigata 9502181, Japan
[3] Univ Tokyo, Inst Cosm Ray Res, Kashiwa, Chiba 2778582, Japan
Semiconductor laser;
Frequency noise;
Optical range finder;
D O I:
10.1117/12.2187963
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
Semiconductor laser range-finder systems use so-called "time-of-flight" methods that require us to modulate semiconductor lasers' intensity and frequency, and detect those of reflected lights, in order to compare optical paths to the reference and the target. But, accurate measurement requires both high-speed modulation and detection systems. By taking advantage of semiconductor lasers' broad-spectrum frequency noise, which has a range of up to a few GHz, and converting it to intensity noise, we were able to generate a set of high-speed physical random numbers that we used to precisely measure the distance. We tuned the semiconductor lasers' oscillation frequencies loosely to the Rb absorption line and converted their frequency noise to intensity noise, in the light transmitted. Observed through a frequency discriminator, beams traveling along two different paths will always share intensity noise patterns, but there is a time lag. We calculate the cross-correlation of the two signals by sweeping their time lags. The one with the highest degree of correlation was that corresponding to the difference in the length of the two optical paths. Through our experiments, we confirmed that the system was accurate up to a distance of 50 m, at a resolution of 0.03 m, when the sampling rate was adjusted to 0.2 ns.