Preparation and characterization of Na-doped ZnO thin films by sol-gel method

被引：59
作者：
Lu, Jianguo [1 ,2 ]
Huang, Kai [3 ]
Zhu, Jianbo [2 ]
Chen, Xuemei [2 ]
Song, Xueping [1 ]
Sun, Zhaoqi [1 ]
机构：
[1] Anhui Univ, Sch Phys & Mat Sci, Hefei 230039, Peoples R China
[2] Hefei Normal Univ, Dept Phys & Elect Engn, Hefei 230061, Peoples R China
[3] Anhui Univ Architecture, Dept Math & Phys, Hefei 230601, Peoples R China
来源：
PHYSICA B-CONDENSED MATTER | 2010年 / 405卷 / 15期
基金：
中国国家自然科学基金; 高等学校博士学科点专项科研基金;
关键词：
Na-doped ZnO; Sol-gel; Atom force microscopy; Photoluminescence spectra; P-TYPE ZNO; OPTICAL-PROPERTIES; TEMPERATURE; PHOTOLUMINESCENCE; LUMINESCENCE; FABRICATION;
D O I：
10.1016/j.physb.2010.04.045
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Undoped and Na-doped ZnO thin films were deposited on Si(1 1 1) substrate by the sol-gel method. Microstructure, surface topography and optical property of the thin films have been investigated. X-ray diffraction analysis showed that all the thin films had a polycrystalline hexagonal wurtzite structure. The 8 at% Na-doped ZnO thin films exhibited high c-axis preferred orientation. Surface topography revealed that average grain size of ZnO thin films annealed at 873 K increased initially, and then decreased with increasing Na concentration, and average grain size of 8 at% Na-doped ZnO thin films increased with increasing annealing temperature. PL spectra showed that all the thin films produced violet and yellow-green emissions in the visible region. In addition, the effects of Na concentration and annealing temperature on microstructure, surface topography and PL spectra are discussed. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码：3167 / 3171
页数：5
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