Simulation of EMC test environments

被引：0
|
作者：
Argyri, V [1 ]
Christopoulos, C [1 ]
机构：
[1] Univ Nottingham, Nottingham NG7 2RD, England
来源：
INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC COMPATIBILITY | 1997年 / 445期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper describes work aimed at a better understanding of the sources of error in EMC tests taken in partially anechoic screened rooms. Two aspects are covered namely the characterization of screened rooms by simulation using the normalised site insertion loss, and, proximity effects on the impedance of test antennas.
引用
收藏
页码：164 / 169
页数：6
相关论文
共 50 条
  • [41] New ways to tame and test EMC
    不详
    EE-EVALUATION ENGINEERING, 2003, 42 (10): : 50 - 50
  • [42] Five steps to a better EMC test
    Brewer, Ron
    EE: Evaluation Engineering, 2010, 49 (05): : 48 - 52
  • [43] Looking for gold in EMC emissions test
    Vitale, P
    EE-EVALUATION ENGINEERING, 1999, 38 (02): : 58 - +
  • [44] EMC Test Requirements for Combat Vehicles
    Kozan, Merve Deniz
    Uysal, M. Murat
    Usta, Erdal
    2017 IV INTERNATIONAL ELECTROMAGNETIC COMPATIBILITY CONFERENCE (EMC TURKIYE), 2017,
  • [45] EMC: Where power and test converge
    Keeton, G
    EE-EVALUATION ENGINEERING, 2003, 42 (04): : 26 - +
  • [46] Directivity of the test device in EMC measurements
    Koepke, G
    Hill, D
    Ladbury, J
    2000 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2, SYMPOSIUM RECORD, 2000, : 535 - 539
  • [47] Assembled PCB EMC test methods
    Coenen, Mart
    Gierstberg, Tom
    van Roermund, Arthur
    2012 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC), 2012, : 493 - 496
  • [48] Generic IC EMC Test Specification
    Steinecke, Thomas
    Bischoff, Michael
    Brandl, Frank
    Hermann, Carsten
    Klotz, Frank
    Mueller, Felix
    Pfaff, Wolfgang
    Unger, Markus
    2012 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC), 2012, : 5 - 8
  • [49] Application of wavelet in test of EMC of car
    Wu Dingchao
    Wang Ke
    Proceedings of the First International Symposium on Test Automation & Instrumentation, Vols 1 - 3, 2006, : 1130 - 1135
  • [50] EMC test infrastructure at BEL, Bangalore
    Ramakrishna, HN
    Nalini, BR
    PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC INTERFERENCE AND COMPATIBILITY '97, 1997, : 387 - 390
12345