Simulation of EMC test environments

被引：0
|
作者：
Argyri, V [1 ]
Christopoulos, C [1 ]
机构：
[1] Univ Nottingham, Nottingham NG7 2RD, England
来源：
INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC COMPATIBILITY | 1997年 / 445期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper describes work aimed at a better understanding of the sources of error in EMC tests taken in partially anechoic screened rooms. Two aspects are covered namely the characterization of screened rooms by simulation using the normalised site insertion loss, and, proximity effects on the impedance of test antennas.
引用
收藏
页码：164 / 169
页数：6
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