Applications of scanning tunneling microscopy to solid state physics

被引：1

作者：

van Kempen, H ^{[1
]}

Boon, EJG ^{[1
]}

van der Wielen, MCMM ^{[1
]}

Wildoer, JWG ^{[1
]}

Prins, MWJ ^{[1
]}

Jansen, R ^{[1
]}

Schad, R ^{[1
]}

机构：

[1] Catholic Univ Nijmegen, Mat Res Inst, NL-6525 ED Nijmegen, Netherlands

来源：

ACTA PHYSICA POLONICA A | 1998年 / 93卷 / 02期

关键词：

D O I：

10.12693/APhysPolA.93.323

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Due to the dependence of the tunnel current to material properties like work function, density of states, and spin polarization the scanning tunneling microscope can be used to study a number of solid state physics problems. This will be illustrated with some examples. The presented examples have in common that also the role of the tip properties have to be taken explicitly into account.

引用

页码：323 / 331

页数：9

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