Waveform metrology: signal measurements in a modulated world

被引:31
作者
Hale, Paul D. [1 ]
Williams, Dylan F. [1 ]
Dienstfrey, Andrew [1 ]
机构
[1] NIST, 325 Broadway, Boulder, CO 80305 USA
关键词
covariance; impedance; waveform; electro-optic sampling; uncertainty; modulated signal; oscilloscope; HIGH-SPEED; SAMPLING OSCILLOSCOPES; UNCERTAINTY ANALYSIS; CALIBRATION; TIME; PULSE; ERROR; COMPENSATION; PROPAGATION; TECHNOLOGY;
D O I
10.1088/1681-7575/aad1cd
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We review the waveform metrology program developed over many years at the National Institute of Standards and Technology. The goal of this program is to provide a measurement service capable of characterizing both temporal and frequency-domain instrumentation used with high-speed communication systems. Under our program, full waveforms as functions of both time and frequency are the target measurands. From these functional waveforms, traditional parametric descriptions can be derived. Furthermore, we give temporal waveforms and their frequency-domain representations consistent and equal consideration, with traceability to the International System of Units. To support this traceability, we emphasize voltage and current waveforms, their relationships, and the ability to transform both nominal values and their uncertainties from one domain to the other.
引用
收藏
页码:S135 / S151
页数:17
相关论文
共 145 条
[1]  
[Anonymous], P IEEE 55 ARFTG C DI
[2]  
[Anonymous], 1990, OPTICAL INTERFACES E
[3]  
[Anonymous], 1972, 154 HEWL PACK
[4]  
[Anonymous], 2002, COMPUTATIONAL METHOD
[5]  
[Anonymous], 2017, PROC 90 ARFTG MICROW
[6]  
[Anonymous], 2017, P 89 ARFTG MICR MEAS
[7]  
[Anonymous], 2016, IEEE Std 802.11-2016, P1, DOI [DOI 10.1109/IEEESTD.2016.7786995, 10.1109/IEEESTD.2016.7786995]
[8]  
[Anonymous], 2011, 1812011 IEEE
[9]  
Auston D H, 1993, ULTRASHORT LASER PUL, V60
[10]   Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors [J].
Avolio, Gustavo ;
Raffo, Antonio ;
Jargon, Jeffrey ;
Hale, Paul D. ;
Schreurs, Dominique M. M. -P. ;
Williams, Dylan F. .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2015, 63 (07) :2353-2363