Measurement of pesticide residues in food based on diffuse reflectance IR spectroscopy

被引:28
作者
Hiroaki, I [1 ]
Toyonori, N [1 ]
Eiji, T [1 ]
机构
[1] Shinshu Univ, Dept Text Syst Engn, Ueda, Nagano, Japan
关键词
agricultural products; Fourier transform infrared diffuse reflectance spectroscopy (FT-IR-DRS); partial least squares regression; pesticide measurement;
D O I
10.1109/TIM.2002.807791
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes a nondestructive pesticide measurement of the agricultural products based on the Fourier transform infrared diffuse reflectance spectroscopy (FT-IR-DRS). Both FT-IR-DRS spectra and the concentration of the pesticide residues are measured for real lettuce samples. Thereafter, the calibration models to estimate the residual concentration of the pesticides are derived by the partial least square regression of the spectra. The cross validations of the calibration models are also carried out. By using this method, it takes two minutes to measure the multi-elements of pesticide residues in a sample lettuce head. The food safety inspection could be enhanced based on FT-IR-DRS.
引用
收藏
页码:886 / 890
页数:5
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