Soft X-ray yield measurement in a small plasma focus operated in neon

被引:77
|
作者
Liu, MH [1 ]
Feng, XP [1 ]
Springham, SV [1 ]
Lee, S [1 ]
机构
[1] Nanyang Technol Univ, Natl Inst Educ, Singapore 259756, Singapore
关键词
crystal spectrograph; PIN photodiode; plasma; plasma focus; pulsed X-ray calorimeter; soft X-ray;
D O I
10.1109/27.669614
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
The United Nations University/International Center for Theoretical Physics Plasma Focus Facility (UNU/ICTP PFF), a small plasma focus, has proven very useful as a training device for research initiation and as a test bed for applications. In this work, its performance in terms of a soft X-ray (SXR) source is examined, The total SSR yield when operated in neon is measured using low-cost detectors, including a calorimeter and a five-channel filtered PIN system. For a charging voltage of 14 kV with 2.9 kJ stored energy, the optimum operating pressure in neon is found to be in the range of 2.7-3.3 torr, resulting in a total SSR yield of 6J/shot into 4 pi steradians measured by the calorimeter in agreement with the PIN detectors. Spectral data shows that 64% of the total SXR yield is contributed by the Ly-alpha and He-alpha lines and 36% by the rest, mainly the radiative recombination. The low total SXR yield (0.2% of stored energy) is consistent with numerical computations of focus dynamics, which reveals that 3% of stored energy is converted into plasma energy. This low conversion rate into plasma energy is due to the large inductance of 110 nH of this simple single-capacitor device. Thus, for development as a SXR source, reduction of inductance is necessary.
引用
收藏
页码:135 / 140
页数:6
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