XPS, AES and LEED studies of Cu deposited on Cr2O3(0001) surfaces

被引：12
|
作者：
Guo, QL
Gui, LL
Moller, PJ
Binau, K
机构：
[1] BEIJING UNIV,INST PHYS CHEM,BEIJING 100871,PEOPLES R CHINA
[2] UNIV COPENHAGEN,HC ORSTED INST,DEPT CHEM,DK-2100 COPENHAGEN,DENMARK
来源：
APPLIED SURFACE SCIENCE | 1996年 / 92卷
基金：
中国国家自然科学基金;
关键词：
D O I：
10.1016/0169-4332(95)00287-1
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The interaction between ultrathin layers of Cu and Cr2O3(0001) surfaces was studied by X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy and low-energy electron diffraction (LEED). The XPS results indicate that copper deposited on the Cr2O3(0001) surfaces is initially in a Cu(I) state, and an agglomeration of copper on the Cr2O3(001)-1 x 1 surface was seen with increasing copper coverage. A Cu(111)R30 degrees/Cr2O3(0001)-1 x 1 epitaxial relationship was observed by LEED.
引用
收藏
页码：513 / 518
页数：6
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