Physical modeling of interference enhanced imaging and characterization of single nanoparticles

被引：31
作者：
Avci, Oguzhan [1 ]
Adato, Ronen [1 ]
Ozkumur, Ayca Yalcin [2 ]
Unlu, M. Selim [1 ,3 ]
机构：
[1] Boston Univ, Dept Elect & Comp Engn, Boston, MA 02215 USA
[2] Bahcesehir Univ, Dept Elect & Elect Engn, TR-34353 Istanbul, Turkey
[3] Boston Univ, Dept Biomed Engn, Boston, MA 02215 USA
来源：
OPTICS EXPRESS | 2016年 / 24卷 / 06期
关键词：
DIAGNOSTICS;
D O I：
10.1364/OE.24.006094
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Interferometric imaging schemes have gained significant interest due to their superior sensitivity over imaging techniques that are solely based on scattered signal. In this study, we outline the theoretical foundations of imaging and characterization of single nanoparticles in an interferometric microscopy scheme, examine key parameters that influence the signal, and benchmark the model against experimental findings. (C) 2016 Optical Society of America
引用
收藏
页码：6094 / 6114
页数：21
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