Development of an angular displacement measurement technique through birefringence heterodyne interferometry

被引:20
作者
Hsieh, Hung-Lin [1 ]
Lee, Ju-Yi [2 ]
Chen, Lin-Yu [2 ]
Yang, Yang [2 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Mech Engn, 43 Keelung Rd, Taipei 10607, Taiwan
[2] Natl Cent Univ, Dept Mech Engn, 300 Zhongda Rd, Taoyuan 32001, Taiwan
关键词
SMALL-ANGLE MEASUREMENT; SURFACE-PLASMON RESONANCE; TOTAL-INTERNAL-REFLECTION; GRATING INTERFEROMETER;
D O I
10.1364/OE.24.006802
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An angular displacement measurement sensor with high resolution for large range measurement is presented. The design concept of the proposed method is based on the birefringence effect and phase detection of heterodyne interferometry. High system symmetry and simple operation can be easily achieved by employing an innovative sandwich optical design for the angular sensor. To evaluate the feasibility and performance of the proposed method, several experiments were performed. The experimental results demonstrate that our angular displacement measurement sensor can achieve a measurement range greater than 26 degrees. Considering the high-frequency noise, the measurement resolution of the system is approximately 1.2 degrees x 10(-4). Because of the common-path arrangement, our proposed method can provide superior immunity against environmental disturbances. (C) 2016 Optical Society of America
引用
收藏
页码:6802 / 6813
页数:12
相关论文
共 24 条
[1]   Development of an Angular Displacement Measurement by Birefringence Heterodyne Interferometry [J].
Chen, Lin-Yu ;
Lee, Ju-Yi ;
Chang, Hung-Sheng ;
Yang, Yang .
SMART SCIENCE, 2015, 3 (04) :188-192
[2]   A new error measurement method to identify all six error parameters of a rotational axis of a machine tool [J].
He, Zhenya ;
Fu, Jianzhong ;
Zhang, Liangchi ;
Yao, Xinhua .
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2015, 88 :1-8
[3]   Determination of retardation parameters of multiple-order wave plate using a phase-sensitive heterodyne ellipsometer [J].
Hsieh, Cheng-Hung ;
Tsai, Chien-Chung ;
Wei, Hsiang-Chun ;
Yu, Li-Ping ;
Wu, Jheng-Syong ;
Chou, Chien .
APPLIED OPTICS, 2007, 46 (23) :5944-5950
[4]   Quasi-common-optical-path heterodyne grating interferometer for displacement measurement [J].
Hsieh, H. L. ;
Lee, J. Y. ;
Wu, W. T. ;
Chen, J. C. ;
Deturche, R. ;
Lerondel, G. .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2010, 21 (11)
[5]   Two-dimensional displacement measurement by quasi-common-optical-path heterodyne grating interferometer [J].
Hsieh, Hung-Lin ;
Chen, Jyh-Chen ;
Lerondel, Gilles ;
Lee, Ju-Yi .
OPTICS EXPRESS, 2011, 19 (10) :9770-9782
[6]   UV imprint fabrication of polymeric scales for optical rotary encoders [J].
Jucius, D. ;
Grybas, I. ;
Grigaliunas, V. ;
Mikolajunas, M. ;
Lazauskas, A. .
OPTICS AND LASER TECHNOLOGY, 2014, 56 :107-113
[7]  
Kasap S., 2001, Optoelectronics and photonics
[8]   Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution [J].
Lee, Ju-Yi ;
Chen, Hui-Yi ;
Hsu, Cheng-Chih ;
Wu, Chyan-Chyi .
SENSORS AND ACTUATORS A-PHYSICAL, 2007, 137 (01) :185-191
[9]   Displacement measurement using a wavelength-phase-shifting grating interferometer [J].
Lee, Ju-Yi ;
Jiang, Geng-An .
OPTICS EXPRESS, 2013, 21 (21) :25553-25564
[10]   Measurement of refractive index variation of liquids by surface plasmon resonance and wavelength-modulated heterodyne interferometry [J].
Lee, Ju-Yi ;
Tsai, Shin-Kai .
OPTICS COMMUNICATIONS, 2011, 284 (04) :925-929