Investigating the relationship between material properties and laser induced damage threshold of dielectric optical coatings at 1064 nm

被引:4
作者
Bassiri, Riccardo [1 ]
Clark, Caspar [2 ]
Martin, Iain W. [3 ]
Markosyan, Ashot [1 ]
Murray, Peter G. [3 ]
Tessmer, Joseph [3 ]
Rowan, Sheila [3 ]
Fejer, Martin M. [1 ]
机构
[1] Stanford Univ, EL Ginzton Lab, Stanford, CA 94305 USA
[2] Helia Photon Ltd, Livingston EH54 7EJ, Scotland
[3] Univ Glasgow, Sch Phys & Astron, SUPA, Glasgow G12 8QQ, Lanark, Scotland
来源
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2015 | 2015年 / 9632卷
关键词
Laser Induced Damage; Photothermal Common-path Interferometry; optical coatings; 1064nm;
D O I
10.1117/12.2194784
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The Laser Induced Damage Threshold (LIDT) and material properties of various multi-layer amorphous dielectric optical coatings, including Nb2O5, Ta2O5, SiO2, TiO2, ZrO2, AlN, SiN, LiF and ZnSe, have been studied. The coatings were produced by ion assisted electron beam and thermal evaporation; and RF and DC magnetron sputtering at Helia Photonics Ltd, Livingston, UK. The coatings were characterized by optical absorption measurements at 1064 nm by Photothermal Common-path Interferometry (PCI). Surface roughness and damage pits were analyzed using atomic force microscopy. LIDT measurements were carried out at 1064 nm, with a pulse duration of 9.6 ns and repetition rate of 100 Hz, in both 1000-on-1 and 1-on-1 regimes. The relationship between optical absorption, LIDT and post-deposition heat-treatment is discussed, along with analysis of the surface morphology of the LIDT damage sites showing both coating and substrate failure.
引用
收藏
页数:8
相关论文
共 8 条
[1]   Photothermal common-path interferometry (PCI): new developments [J].
Alexandrovski, Alexei ;
Fejer, Martin ;
Markosyan, Ashot ;
Route, Roger .
SOLID STATE LASERS XVIII: TECHNOLOGY AND DEVICES, 2009, 7193
[2]   Green-induced infrared absorption in MgO doped LiNbO3 [J].
Furukawa, Y ;
Kitamura, K ;
Alexandrovski, A ;
Route, RK ;
Fejer, MM ;
Foulon, G .
APPLIED PHYSICS LETTERS, 2001, 78 (14) :1970-1972
[3]   THE ROLE OF THERMAL-CONDUCTIVITY IN THE PULSED LASER DAMAGE SENSITIVITY OF OPTICAL THIN-FILMS [J].
GUENTHER, AH ;
MCIVER, JK .
THIN SOLID FILMS, 1988, 163 :203-214
[4]  
Hass G., 1952, VACUUM, V2, P331
[5]  
House R. A., 1975, NBS SPEC PUBL, V435, P305
[6]   LASER-INDUCED SURFACE AND COATING DAMAGE [J].
LOWDERMILK, WH ;
MILAM, D .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1981, 17 (09) :1888-1903
[7]   Spontaneous and induced absorption in amorphous Ta2O5 dielectric thin films [J].
Markosyan, A. S. ;
Route, R. ;
Fejer, M. M. ;
Patel, D. ;
Menoni, C. S. .
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2011, 2011, 8190
[8]  
Wood R. M., 1975, Optics and Laser Technology, V7, P105, DOI 10.1016/0030-3992(75)90068-7