Direct investigation on conducting nanofilaments in single-crystalline Ni/NiO core/shell nanodisk arrays

被引：18

作者：

Hwang, Inrok ^{[1
]}

Choi, Jinsik ^{[1
]}

Hong, Sahwan ^{[1
]}

Kim, Jin-Soo ^{[1
]}

Byun, Ik-Su ^{[1
]}

Bahng, Jae Ho ^{[2
]}

Koo, Ja-Yong ^{[2
]}

Kang, Sung-Oong ^{[1
]}

Park, Bae Ho ^{[1
]}

机构：

[1] Konkuk Univ, Dept Phys, Div Quantum Phases & Devices, Seoul 143701, South Korea

[2] Korea Res Inst Stand & Sci, Taejon 305600, South Korea

来源：

APPLIED PHYSICS LETTERS | 2010年 / 96卷 / 05期

关键词：

arrays; atomic force microscopy; contact resistance; electrical conductivity; electrodes; electroforming; nanostructured materials; nickel; nickel compounds; DENSITY NONVOLATILE MEMORY; RESISTANCE; SRTIO3; FILMS;

D O I：

10.1063/1.3301620

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report resistive switching characteristics of single-crystalline Ni/NiO core/shell nanodisk arrays, in which the conducting filaments are highly localized on the surface of nanostructure. The local current distributions observed in such a single-grained nanodisk demonstrate that the contact area and the contact time between the conductive tip of conducting atomic force microscopy and the surface of nanodisk critically influence the voltage-stress-induced electroforming behaviors of nanofilaments in NiO switching nanoblocks. These contact parameters, such as the contact area and the contact time, are interpreted to the electrode size and the voltage-stress time for the formation of filaments in metal oxides.

引用

页数：3

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