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Review-Advances in Scanning Electrochemical Microscopy (SECM)
被引:80
作者:
Zoski, Cynthia G.
[1
]
机构:
[1] New Mexico State Univ, Dept Chem & Biochem, Las Cruces, NM 88003 USA
基金:
美国国家科学基金会;
关键词:
HETEROGENEOUS ELECTRON-TRANSFER;
SINGLE NANOPARTICLE COLLISIONS;
THIN-LAYER ELECTROCHEMISTRY;
SURFACE INTERROGATION MODE;
STEADY-STATE;
OXYGEN REDUCTION;
HIGH-RESOLUTION;
SI-SECM;
ELECTROPHORETIC MIGRATION;
ELECTROCATALYTIC ACTIVITY;
D O I:
10.1149/2.0141604jes
中图分类号:
O646 [电化学、电解、磁化学];
学科分类号:
081704 ;
摘要:
Scanning electrochemical microscopy (SECM) is unique among scanning probe methods in its quantitative rigor and in its ability to study samples in liquid environments with ease. SECM has become a popular and mature technique with a wide range of applications in electrochemical imaging, chemical kinetics, biological redox processes, and electrocatalytic reactions, among others. A major development in recent years is the ongoing shift from micrometer-scale experiments to the nanoscale. Recent advances in methodology have greatly increased the capacity of SECM to characterize interfaces at the nanoscale and to obtain molecular-level chemical information. The principles of SECM will be briefly introduced, and recent advances using this technique will be discussed. (C) 2015 The Electrochemical Society. [DOI: 10.1149/2.0141604jes] All rights reserved.
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页码:H3088 / H3100
页数:13
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