FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems

被引：3

作者：

Bauer, Susanne ^{[1
]}

Renhart, Werner ^{[1
]}

Biro, Oszkar ^{[1
]}

机构：

[1] Graz Univ Technol, Inst Fundamentals & Theory Elect Engn, A-8010 Graz, Austria

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2017年 / 53卷 / 06期

关键词：

Eddy currents; electromagnetic compatibility (EMC); electrostatics; FEM;

D O I：

10.1109/TMAG.2017.2651171

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.

引用

页数：4

共 4 条

[1] FEM-based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems
Bauer, Susanne
Renhart, Werner
Biro, Oszkar
2016 IEEE CONFERENCE ON ELECTROMAGNETIC FIELD COMPUTATION (CEFC), 2016,
[2] FEM-based calculation of short-time withstand current for air circuit breaker
Niu, Chunping
Dong, Delong
Sun, Hao
Ning, Jiaqi
Yang, Fei
Wu, Yi
Rong, Mingzhe
Niu, C. (niuyue@mail.xjtu.edu.cn), 1600, Electric Power Automation Equipment Press (34): : 85 - 90
[3] Classification of problems under uncertainty, in FEM-based analysis and design of sheet metal forming operations
Strano, Matteo
Burdi, Andrea
SHEET METAL 2007, 2007, 344 : 817 - +
[4] Development of incremental FEM based deformation model for continuous caster strand, incorporation of Aitken-Steffensen algorithm for fast computation and sensitivity analysis of constitutive parameters on the predictions of stress-strain
Ghosh, S
Basu, B
Goyal, S
Dixit, US
INTERNATIONAL CONFERENCE ON SOLIDIFICATION SCIENCE AND PROCESSING: OUTLOOK FOR THE 21ST CENTURY, 2001, : 303 - 310

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