Beam profile Measurement of THz pulses in a TDS system

被引：0

作者：

Zeng, Yang ^{[1
]}

Andy, Andre Sarker ^{[1
]}

Kreouzis, Theo ^{[2
]}

Chen, Xiaodong ^{[1
]}

Donnan, Robert S. ^{[1
]}

机构：

[1] Queen Mary Univ London, Sch Elect Engn & Comp Sci, London E1 4NS, England

[2] Univ London, Sch Phys & Astron, London E1 4NS, England

来源：

2015 40TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ) | 2015年

关键词：

TERAHERTZ SPECTROSCOPY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Beam profile measurement of broadband THz pulses in a TDS system are carried out by analyzing the spatial distribution of the pulse. Beam-waists of different frequency components are calculated. Overall the waist decreases with the increasing frequency with higher order modes being observed.

引用

页数：2

共 4 条

[1]

Goldsmith P.F., 1998, Quasioptical Systems: Gaussian Beam Quasioptical Propagation and Applications

[2] Terahertz spectroscopy and imaging - Modern techniques and applications [J].

Jepsen, Peter Uhd ;

Cooke, David G. ;

Koch, Martin .

LASER & PHOTONICS REVIEWS, 2011, 5 (01) :124-166

[3] Terahertz spectroscopy: a powerful new tool for the chemical sciences? [J].

McIntosh, Alexander I. ;

Yang, Bin ;

Goldup, Stephen M. ;

Watkinson, Michael ;

Donnan, Robert S. .

CHEMICAL SOCIETY REVIEWS, 2012, 41 (06) :2072-2082

[4]

Tianwu W., 2014, TERAHERTZ SCI TECHNO, V4, P425

← 1 →