The non-destructive threshold of the graphite surface by STM in the ultra-fast pulse mode

被引：2

作者：

Xu Chun-Kai ^{[1
]}

Wei Zheng ^{[1
]}

Chen Xiang-Jun ^{[1
]}

Xu Ke-Zun ^{[1
]}

机构：

[1] Univ Sci & Technol China, Dept Modern Phys, Hefei Natl Lab Phys Sci Microscale, Hefei 230026, Anhui, Peoples R China

来源：

CHINESE PHYSICS | 2007年 / 16卷 / 08期

关键词：

non-destructive threshold; voltage pulse; scanning tunnelling microscope; SCANNING-TUNNELING-MICROSCOPE; ENERGY-LOSS SPECTROSCOPY; FIELD-EMISSION CONDITIONS; ELEMENTAL ANALYSIS; PROBE MICROSCOPE; TIP; ELECTRONS; CONTACT; SILICON;

D O I：

10.1088/1009-1963/16/8/026

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

In this paper single ultra-fast voltage pulses are introduced to the Pt/Ir tip of a scanning tunnelling microscope (STM), and the non-destructive threshold of the graphite surface is studied sysematically in a wide range of pulse durations (from 10(4 to) 8 ns). Considering the waveform distortion of the pulses at the tunnelling region, this paper gives the corrected threshold curve of pulse amplitude depending on pulse duration. A new explanation of threshold power has been suggested and fits the experimental results well.

引用

页码：2315 / 2318

页数：4

共 23 条

[1]

Bazant Z.P., 1997, APPL MECH REV, V10, P593, DOI DOI 10.1115/1.3101672

[2] FIELD EVAPORATION BETWEEN A GOLD TIP AND A GOLD SURFACE IN THE SCANNING TUNNELING MICROSCOPE CONFIGURATION [J].