Interactions between silica particles in the presence of multivalent coions

被引:10
|
作者
Uzelac, Biljana [1 ]
Valmacco, Valentina [1 ,2 ]
Trefalt, Gregor [1 ]
机构
[1] Univ Geneva, Dept Inorgan & Analyt Chem, Sci 2,30 Quai Ernest Ansermet, CH-1205 Geneva, Switzerland
[2] Firmenich Co, Corp R&D Div, Rue Bergere 7, CH-1217 Geneva, Switzerland
基金
瑞士国家科学基金会;
关键词
ATOMIC-FORCE MICROSCOPE; ELECTRICAL DOUBLE-LAYER; SCHULZE-HARDY RULE; ELECTROLYTE-SOLUTIONS; COLLOIDAL PARTICLES; CHARGED-PARTICLES; HYDRATION FORCES; AQUEOUS-SOLUTIONS; REPULSIVE FORCES; SURFACES;
D O I
10.1039/c7sm01168g
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Forces between charged silica particles in solutions of multivalent coions are measured with colloidal probe technique based on atomic force microscopy. The concentration of 1 : z electrolytes is systematically varied to understand the behavior of electrostatic interactions and double-layer properties in these systems. Although the coions are multivalent the Derjaguin, Landau, Verwey, and Overbeek (DLVO) theory perfectly describes the measured force profiles. The diffuse-layer potentials and regulation properties are extracted from the forces profiles by using the DLVO theory. The dependencies of the diffuse-layer potential and regulation parameter shift to lower concentration with increasing coion valence when plotted as a function of concentration of 1 : z salt. Interestingly, these profiles collapse to a master curve if plotted as a function of monovalent counterion concentration.
引用
收藏
页码:5741 / 5748
页数:8
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