Probe Characterization for Electromagnetic Near-Field Studies

被引：48

作者：

Jarrix, Sylvie ^{[1
]}

Dubois, Tristan ^{[1
]}

Adam, Ronan ^{[1
]}

Nouvel, Philippe ^{[1
]}

Azais, Bruno ^{[2
]}

Gasquet, Daniel ^{[1
]}

机构：

[1] Univ Montpellier 2, Inst Elect Sud, UMR CNRS UM2 5214, F-34095 Montpellier, France

[2] Ctr Etud Gramat, F-46500 Gramat, France

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2010年 / 59卷 / 02期

关键词：

Electric field; electromagnetic (EM) analysis; magnetic field; probe antennas; reflection; simulation; CALIBRATION;

D O I：

10.1109/TIM.2009.2023148

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Probes used for contactless electromagnetic field capture or injection are characterized. Depending on the probe structure, they interact preferentially with the electric or magnetic field. The optimal size of the probes for broad-frequency-band measurements is investigated. However, it is shown particularly for the magnetic field probe that considerations about the size and the structures presented in this paper are not sufficient for a good discrimination between electric and magnetic fields. Then, the space resolution of near-field measurements is discussed, with application to the field capture of a microstrip line under operation.

引用

页码：292 / 300

页数：9

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