Melt Flow before Crystal Seeding in Cz Si Growth with Transversal MF

被引:7
作者
Iizuka, Masaya [1 ]
Mukaiyama, Yuji [1 ]
Demina, S. E. [2 ]
Kalaev, V. V. [2 ]
机构
[1] STR Japan KK, Hodogaya Ku, East Tower 15F,Yokohama Business Pk,134,Goudo Cho, Yokohama, Kanagawa 2400005, Japan
[2] Soft Impact Ltd, STR Grp, Engels Av 27, St Petersburg 194156, Russia
关键词
Computer simulation; Convection; Heat transfer; Magnetic field assisted Czochralski method; Semiconducting silicon; CZOCHRALSKI SILICON GROWTH; FREE-SURFACE;
D O I
10.1016/j.jcrysgro.2016.11.002
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Industrial Cz growth of Si crystal of 300 mm and higher diameter usually requires DC magnetic fields (MFs) to suppress turbulence in the melt. We present 3D unsteady analysis of melt turbulent convection in an industrial Cz system coupled with the effect of the transversal MF for different argon gas flow rates for the stage before crystal seeding. We have performed detailed 2D axisymmetric modeling of global heat transfer in the whole Cz furnace. Radiative heat fluxes obtained in 2D modeling have been used in detailed 3D steady and unsteady modeling of crystallization zone. LES method is applied as a predictive approach for modeling of turbulent flow of silicon melt. We have obtained flow structure and temperature distribution in the melt, which were different from previously reported data. We have observed a well-fixed dark spike which includes low temperature melt area on the melt free surface in MF cases. These results indicates that MF and argon flow rate conditions are important to achieve stable positioning of the dark spike on the melt free surface for optimized crystal seeding without uncontrollable meltdown and single crystal structure loss.
引用
收藏
页码:510 / 513
页数:4
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