Surface Photovoltage Measurement of Perovskite Solar Cells to Screen Carrier Selective Contacts

被引：0

作者：

Kavadiya, Shalinee ^{[1
]}

Onno, Arthur ^{[1
]}

Boyd, Caleb ^{[2
]}

Yu, Zhengshan ^{[1
]}

McGehee, Michael ^{[2
]}

Holman, Zachary C. ^{[1
]}

机构：

[1] Arizona State Univ, Tempe, AZ 85281 USA

[2] Univ Colorado, Boulder, CO 80309 USA

来源：

2020 47TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) | 2020年

关键词：

Surface photovoltage; Kelvin probe method; perovskite solar cells; carrier selective contacts; silicon solar cells; SPECTROSCOPY;

D O I：

10.1109/pvsc45281.2020.9300489

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

SPV measurement through the Kelvin probe method is described. Silicon heterojunction structures show the maximum SPV of 700 V. Measurement on perovskite structures, and the results suggest adding BCP with C60 enhances the selectivity of C60 electron contact. Furthermore, PTAA and PTAA/PFN have similar selectivity but NiOx is poorly selective. SPV is an easy way to provide a relative comparison between various cell structures and contact layers to determine the relative extractable V-oc and properties of the contact layer (selectivity, passivation) limiting the efficiency.

引用

页码：1439 / 1440

页数：2

共 5 条

[1] Surface Photovoltage Spectroscopy Study of Organo-Lead Perovskite Solar Cells [J].