Structural and topological changes in silica glass at pressure

被引:158
作者
Benmore, C. J. [1 ,2 ]
Soignard, E. [3 ]
Amin, S. A. [3 ]
Guthrie, M. [1 ,4 ]
Shastri, S. D. [1 ]
Lee, P. L. [1 ]
Yarger, J. L. [2 ,3 ]
机构
[1] Argonne Natl Lab, Adv Photon Source, Xray Sci Div, Argonne, IL 60439 USA
[2] Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA
[3] Arizona State Univ, Dept Chem & Biochem, Tempe, AZ 85287 USA
[4] Carnegie Inst Sci, Geophys Lab, EFree Ctr, Washington, DC 20015 USA
关键词
SIO2; GLASS; BINARY-ALLOYS; DIFFRACTION; RESISTIVITY; QUARTZ;
D O I
10.1103/PhysRevB.81.054105
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effects of high pressures on the structure of silica glass have been elucidated using high-energy x-ray diffraction up to 43.5 GPa. A decrease in the first two peak positions in the real-space pair-distribution functions up to 15 GPa indicates an initial shrinkage of the tetrahedral units. Above this threshold pressure the Si-O bond peak shape becomes asymmetric and the average Si-O bond length and coordination number both increase linearly with pressure. Also, strained geometries in the O-O correlations lead a pronounced topological rearrangement of the second and third nearest neighbors.
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页数:5
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