Investigation of low-cost through glass vias formation on borosilicate glass by picosecond laser-induced selective etching

被引:35
作者
Chen, Li [1 ]
Yu, Daquan [1 ,2 ]
机构
[1] Xiamen Univ, Sch Elect Sci & Engn, Xiamen 361000, Peoples R China
[2] Xiamen Sky Semicond Technol Co Ltd, Xiamen 361000, Peoples R China
基金
中国国家自然科学基金;
关键词
FUSED-SILICA; HIGH-DENSITY; OPTIMIZATION; FABRICATION; SUBSTRATE; DESIGN;
D O I
10.1007/s10854-021-06205-w
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reports selective etching process of borosilicate glass by laser-induced deep etching (LIDE) for through glass via (TGV) applications. Picosecond laser is used to modify the glass substrate, and then, with the help of the laser-induced selective etching (LISE), the modified glass samples are etched by hydrofluoric acid (HF) solution to complete the manufacture of TGV in the present experiments. Here we experimentally study the micro mechanism of LISE on borosilicate glass. At the laser affected zone (LAZ), a series of nanovoids along the path of laser beam propagating are observed, which contribute to enhanced etchability of LAZ when the glass sample is immersed in HF solution. Further, the mechanism of the fabrication of TGV is investigated, and the effect of key factors, including laser pulses, the concentration of HF solution and the chemical composition of borosilicate glass on TGV profile are studied. When compared with laser pulses, the effect of concentration of HF solution and the chemical composition on TGV profile is more remarkable. Optimized results show that vertical vias (similar to 90 degrees) can be achieved on borosilicate glass.
引用
收藏
页码:16481 / 16493
页数:13
相关论文
共 34 条
[1]  
Banijamali B, 2011, ELEC COMP C, P285, DOI 10.1109/ECTC.2011.5898527
[2]   Polarization sensitive elements fabricated by femtosecond laser nanostructuring of glass [Invited] [J].
Beresna, Martynas ;
Gecevicius, Mindaugas ;
Kazansky, Peter G. .
OPTICAL MATERIALS EXPRESS, 2011, 1 (04) :783-795
[3]  
Hsieh YC, 2016, INT MICRO PACK ASS, P87, DOI 10.1109/IMPACT.2016.7800071
[4]   Deep wet etching of borosilicate glass and fused silica with dehydrated AZ4330 and a Cr/Au mask [J].
Jin, Joo-Young ;
Yoo, Sunghyun ;
Bae, Jae-Sung ;
Kim, Yong-Kweon .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2014, 24 (01)
[5]   Laser-induced microexplosion confined in a bulk of silica: Formation of nanovoids [J].
Juodkazis, Saulius ;
Misawa, Hiroaki ;
Hashimoto, Tomohiro ;
Gamaly, Eugene G. ;
Luther-Davies, Barry .
APPLIED PHYSICS LETTERS, 2006, 88 (20)
[6]   Rapid micromachining of high aspect ratio holes in fused silica glass by high repetition rate picosecond laser [J].
Karimelahi, Samira ;
Abolghasemi, Ladan ;
Herman, Peter R. .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2014, 114 (01) :91-111
[7]   Electrical Modeling and Characterization of Through Silicon via for Three-Dimensional ICs [J].
Katti, Guruprasad ;
Stucchi, Michele ;
De Meyer, Kristin ;
Dehaene, Wim .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2010, 57 (01) :256-262
[8]  
Kim N, 2011, ELEC COMP C, P1160, DOI 10.1109/ECTC.2011.5898657
[9]  
Koechner W., 2006, SOLID STATE LASER EN, P493, DOI [10.1007/0-387-29338-8, DOI 10.1007/0-387-29338-8]
[10]   High-Density Through Silicon Vias for 3-D LSIs [J].
Koyanagi, Mitsumasa ;
Fukushima, Takafumi ;
Tanaka, Tetsu .
PROCEEDINGS OF THE IEEE, 2009, 97 (01) :49-59