Effects of primary aberrations on the fluorescence depletion patterns of STED microscopy

被引:69
作者
Deng, Suhui [1 ,2 ]
Liu, Li [1 ]
Cheng, Ya [1 ]
Li, Ruxin [1 ]
Xu, Zhizhan [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, State Key Lab High Field Laser Phys, Shanghai 201800, Peoples R China
[2] Chinese Acad Sci, Grad Univ, Beijing 100039, Peoples R China
关键词
FOCUSING OPTICAL-SYSTEMS; SPHERICAL-ABERRATION; SEIDEL ABERRATIONS; VECTOR DIFFRACTION; VORTEX BEAMS; FIELD; ASTIGMATISM; COMA;
D O I
10.1364/OE.18.001657
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Effects of primary aberrations including spherical aberration, coma and astigmatism on the three fluorescence depletion patterns mainly used in stimulated emission of depletion (STED) microscopy are investigated by using vectorial integral. The three depletion patterns are created by inserting a vortex phase plate, a central half-wavelength plate or a semi-circular half-wavelength mask within Gaussian beam respectively. Attention is given to the modification of the shape, peak intensity, the central intensity of the dark hole and the hole size of these depletion patterns in the presence of primary aberrations. (C) 2010 Optical Society of America
引用
收藏
页码:1657 / 1666
页数:10
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