Grain boundaries in silicon: Microstructure and minority carrier recombination

被引：0

作者：

Krinke, J ^{[1
]}

Albrecht, M ^{[1
]}

Dorsch, W ^{[1
]}

Voigt, A ^{[1
]}

Strunk, HP ^{[1
]}

Steiner, B ^{[1
]}

Wagner, G ^{[1
]}

机构：

[1] UNIV ERLANGEN NURNBERG,INST WERKSTOFFWISSENSCH,LEHRSTUHL MIKROCHARAKTERISIERUNG,D-91058 ERLANGEN,GERMANY

来源：

CONFERENCE RECORD OF THE TWENTY FIFTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1996 | 1996年

关键词：

D O I：

10.1109/PVSC.1996.564046

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

引用

页码：473 / 476

页数：4

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