Inverted bit-line sense amplifier with offset-cancellation capability

被引:10
作者
Park, J. [1 ]
Shin, D. -H. [1 ]
Cho, Y. -H. [1 ]
Kwon, K. -W. [2 ]
机构
[1] Samsung Elect Co, DRAM Design Team, Hwaseong, South Korea
[2] Sungkyunkwan Univ, Coll Informat & Commun Engn, Suwon, South Korea
关键词
amplifiers; DRAM chips; inverted bit-line sense amplifier; offset-cancellation capability; low-power DRAM applications; read failure; Vth variability; power supply; storage capacity 8 Gbit; size; 20; nm;
D O I
10.1049/el.2015.4368
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An inverted bit-line sense amplifier (BLSA) equipped with offset compensation capability for low-power DRAM applications is proposed. The sequential operation of the inverted BLSA allows us to eliminate the edge dummy array in an open bit-line structure resulting in 1.7% less total chip area despite of 10% area penalty of the proposed BLSA occupied by extra switches. For 8-Gb DRAM in 20-nm class technology, the read failure induced by Vth variability is completely removed due to the offset cancellation. The proposed BLSA maintains the gradual increase of the sensing delay when decreasing the power supply down to 0.6 V, while intrinsic read fail prevails below 0.9 V with the conventional one.
引用
收藏
页码:692 / 693
页数:2
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