Electrical characteristics of Pt-ZnO Schottky nano-contact

被引:7
|
作者
Shao ZhengZheng [1 ]
Zhang XueAo [1 ]
Wang XiaoFeng [1 ]
Chang ShengLi [1 ]
机构
[1] Natl Univ Def Technol, Coll Sci, Ctr Mat Sci, Changsha 410073, Hunan, Peoples R China
基金
国家高技术研究发展计划(863计划);
关键词
ZnO nanorod; Schottky contact; ideality factor; GROWTH; DIODES;
D O I
10.1007/s11433-010-0077-2
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The electrical characteristics of Pt-ZnO Schottky nano-contact have been studied. Well aligned ZnO nanorod arrays were synthesized by two-step wet-chemical method. A Pt-coated conducting probe of atomic force microscope was placed on the head face of the ZnO nanorod, thereby forming a Pt-ZnO nano-contact. The I-V characteristic curve shows that the Pt-ZnO nano-contact exhibits rectifying effect, like a Schottky diode with an ideality factor of 3.2 and a reverse-bias breakdown voltage more than -10 V. The study suggests that a high electric field is induced on the ZnO beneath the contact point when a bias voltage is applied, hence, the Schottky barrier thickness is decreased, and results in easier tunneling across the Pt-ZnO interface and a large ideality factor.
引用
收藏
页码:64 / 67
页数:4
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