Fluorescence dynamics in Tm,Ho:YLF following 800 nm pulsed laser excitation

被引:19
作者
Falconieri, M [1 ]
Lanzi, A [1 ]
Salvetti, G [1 ]
Toncelli, A [1 ]
机构
[1] ENEA, CR Casaccia, Div Nuovi Mat, I-00060 Rome, Italy
来源
APPLIED PHYSICS B-LASERS AND OPTICS | 1998年 / 66卷 / 02期
关键词
D O I
10.1007/s003400050369
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have performed spectroscopic studies that examined the time evolution of the fluorescence at wavelengths between 400 and 2500 nm, emitted from an optically excited Tm,Ho:YLF crystal in response to pulsed laser excitation at 780 nm. The fluorescence intensity decay patterns have been analyzed in terms of their time and amplitude characteristics, paying attention to the dependence of these characteristics on excitation laser fluence. With the aid of a simplified model for numerical simulations, we have been able to quantify and evaluate the effects of a number of processes whose relative importance varies with excitation fluence, such as upconversion losses and ground-state depletion.
引用
收藏
页码:153 / 162
页数:10
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