Fault diagnosis in scan-based BIST

被引：24

作者：

Rajski, J ^{[1
]}

Tyszer, J ^{[1
]}

机构：

[1] Mentor Graph Corp, Wilsonville, OR 97070 USA

来源：

ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年

关键词：

D O I：

10.1109/TEST.1997.639704

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The paper presents a new fault diagnosis technique for scan-based BIST designs. It can be used for non-adaptive identification of the scan cells that are driven by erroneous signals, irrespective of the error multiplicity. The proposed scheme employs a simple scan cell selection hardware which in conjunction with a conventional signature analysis allows flexible trade-offs between the test application time and the diagnostic resolution.

引用

页码：894 / 902

页数：9