An application of two-photon entangled states to quantum metrology

被引：44
作者：
Brida, G [1 ]
Genovese, M [1 ]
Novero, C [1 ]
机构：
[1] Ist Elettrotecn Nazl Galileo Ferraris, I-10135 Turin, Italy
来源：
JOURNAL OF MODERN OPTICS | 2000年 / 47卷 / 12期
关键词：
D O I：
10.1080/09500340008235132
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Besides many interesting applications to the study of the foundations of quantum mechanics, entangled states are now assuming much relevance for some practical applications. In particular, we discuss the use of two-photon entangled states produced in parametric down conversion for absolute quantum efficiency calibration of photodetectors, in the photon counting regime.
引用
收藏
页码：2099 / 2104
页数：6
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