Transient interface sharpening in miscible alloys

被引：66

作者：

Erdélyi, Z

Sladecek, M

Stadler, LM

Zizak, I

Langer, GA

Kis-Varga, M

Beke, DL

Sepiol, B

机构：

[1] Univ Debrecen, Dept Solid State Phys, H-4010 Debrecen, Hungary

[2] Hungarian Acad Sci, Nucl Res Inst, H-4100 Debrecen, Hungary

[3] Univ Vienna, Inst Mat Phys, A-1090 Vienna, Austria

[4] Hahn Meitner Inst Berlin GmbH, D-14109 Berlin, Germany

来源：

SCIENCE | 2004年 / 306卷 / 5703期

关键词：

D O I：

10.1126/science.1104400

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

We observed that diffuse interfaces sharpen rather than broaden in completely miscible ideal binary systems. This is shown in situ during heat treatments at gradually increasing temperatures by scattering of synchrotron radiation in coherent Mo/V multilayers containing initially diffuse interfaces. This effect provides a useful tool for the improvement of interfaces and offers a way to fabricate better x-ray or neutron mirrors, microelectronic devices, or multilayers with giant magnetic resistance.

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页码：1913 / 1915

页数：3

相关论文

共 11 条

[1] Thermal stability of Mo-V epitaxial multilayers [J].

Dudás, A ;

Langer, GA ;

Beke, DL ;

Kis-Varga, M ;

Daróczi, L ;

Erdélyi, Z .

JOURNAL OF APPLIED PHYSICS, 1999, 86 (04) :2008-2013

[2] Interface sharpening instead of broadening by diffusion in ideal binary alloys -: art. no. 165901 [J].

Erdélyi, Z ;

Szabó, IA ;

Beke, DL .

PHYSICAL REVIEW LETTERS, 2002, 89 (16) :1-165901

[3] Stress effects on diffusional interface sharpening in ideal binary alloys -: art. no. 092102 [J].

Erdélyi, Z ;

Beke, DL .

PHYSICAL REVIEW B, 2003, 68 (09)

[4] Investigation of the interplay of nickel dissolution and copper segregation in Ni/Cu(111) system [J].

Erdélyi, Z ;

Girardeaux, C ;

Tôkei, Z ;

Beke, DL ;

Cserháti, C ;

Rolland, A .

SURFACE SCIENCE, 2002, 496 (1-2) :129-140

[5] STRUCTURAL REFINEMENT OF SUPERLATTICES FROM X-RAY-DIFFRACTION [J].

FULLERTON, EE ;

SCHULLER, IK ;

VANDERSTRAETEN, H ;

BRUYNSERAEDE, Y .

PHYSICAL REVIEW B, 1992, 45 (16) :9292-9310

[6]

JESSON DE, 1997, HDB THIN FILM PROCES, VF

[7] SUBSTRATE-TEMPERATURE EFFECT ON GIANT MAGNETORESISTANCE OF SPUTTERED CO/CU MULTILAYERS [J].

KANO, H ;

KAGAWA, K ;

SUZUKI, A ;

OKABE, A ;

HAYASHI, K ;

ASO, K .

APPLIED PHYSICS LETTERS, 1993, 63 (20) :2839-2841

[8] Segregation and strain relaxation in Au/Ni multilayers:: An in situ experiment [J].

Labat, S ;

Gergaud, P ;

Thomas, O ;

Gilles, B ;

Marty, A .

APPLIED PHYSICS LETTERS, 1999, 75 (07) :914-916

[9] MICROCRYSTALLINE AND INTERFACE STRUCTURE OF METALLIC MULTILAYERS FROM X-RAY-SPECTRA [J].

STEARNS, MB .

PHYSICAL REVIEW B, 1988, 38 (12) :8109-8113

[10] Diffusion and surface segregation in thin SiGe/Si layers studied by scanning transmission electron microscopy [J].

Walther, T ;

Humphreys, CJ ;

Robbins, DJ .

DEFECT AND DIFFUSION FORUM, 1997, 143 :1135-1140