Continuous-wave Z-scan measurement of photorefractive SBN:60

被引：4
|
作者：
Siahmakoun, A [1 ]
Breitling, D
Najaf-Zadeh, RA
机构：
[1] Rose Hulman Inst Technol, Dept Phys & Appl Opt, Terre Haute, IN 47803 USA
[2] Purdue Univ Calumet, Dept Chem & Phys, Hammond, IN 46323 USA
来源：
APPLIED OPTICS | 2000年 / 39卷 / 29期
关键词：
D O I：
10.1364/AO.39.005360
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A cw-probe Z-scan technique was employed to measure the photoinduced index change in a photorefractive SBN:60 crystal. For this experiment a three-detector data-acquisition system was used to account for temporal changes in the laser. The effects of various beam parameters such. as intensity, polarization, and wavelength were studied. A theoretical simulation of the Z scan based on a band-transport model of photorefractive-index variation was also developed. This model provides reasonable agreement with the experimental results. (C) 2000 Optical Society of America. OCIS codes: 160.5320, 160.4330, 190.4400, 190.5330, 190.7070.
引用
收藏
页码：5360 / 5366
页数：7
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