D17: the new reflectometer at the ILL

被引:204
作者
Cubitt, R [1 ]
Fragneto, G [1 ]
机构
[1] Inst Max Von Laue Paul Langevin, F-38042 Grenoble, France
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2002年 / 74卷 / Suppl 1期
关键词
PACS: 61.12.h;
D O I
10.1007/s003390201611
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The reflectometer D17 has been operational for a year and has already proved to be an excellent tool for investigating surfaces and interfaces in the realms of physics, biology and chemistry. The instrument has two modes of operation, time-of-flight and monochromatic, the latter incorporating the polarised-neutron option. Both modes are flexible in the wave-vector-transfer (q) resolution. The loosest resolution required to resolve the sample structure can be chosen (and hence the highest flux), enabling the lowest reflectivities and hence the widest q-range to be measured.
引用
收藏
页码:S329 / S331
页数:3
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