Simultaneous Single-Event Transient (SET) Observation on LM139A Wired-and Comparator Circuit

被引：1

作者：

Morand, S. ^{[1
]}

Binois, C. ^{[1
]}

de Fleurieu, H. Claret ^{[1
]}

Carvalho, A. ^{[1
]}

Samaras, A. ^{[2
]}

Clatworthy, T. ^{[3
]}

Kruckmeyer, K. ^{[4
]}

Marin, M. ^{[2
]}

Mangeret, R. ^{[2
]}

Salvaterra, G. ^{[1
]}

Staerk, D. ^{[5
]}

机构：

[1] Airbus Def & Space, F-78996Z Elancourt, France

[2] Airbus Def & Space, F-31402 Toulouse, France

[3] Airbus Def & Space, Portsmouth PO3 5PU, Hants, England

[4] Texas Instruments Inc, Santa Clara, CA 95052 USA

[5] TESAT, D-71522 Backnang, Germany

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2021年 / 68卷 / 06期

关键词：

Ions; Lasers; Laser beams; Xenon; Sensitivity; Photonics; Correlation; Bipolar circuits; bipolar devices; charge sharing; comparator; electrical coupling; heavy ions; single-event transient (SET); single photon absorption (SPA); transient analysis; transient propagation; transient response; wired-AND;

D O I：

10.1109/TNS.2020.3043146

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The sensitivity of the LM139A quad voltage comparator toward simultaneous single-event transient has been investigated through laser single photon absorption. The results have been supported and compared to heavy-ion tests. The analysis of sensitivity leads to the observation of two sensitive cases related to internal charge-sharing mechanism between comparator function and input line coupling effects.

引用

页码：1279 / 1285

页数：7

共 4 条

[1] Application determinance of single-event transient characteristics in the LM111 comparator
Sternberg, AL
Massengill, LW
Schrimpf, RD
Calvel, P
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2001, 48 (06) : 1855 - 1858
[2] A novel high-precision single-event transient hardened voltage comparator design
Xie, Yuqiao
Liu, Zhongyang
Xu, Tao
Bi, Dawei
Hu, Zhiyuan
Zhang, Zhengxuan
Zou, Shichang
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 2023, 51 (10) : 4864 - 4878
[3] Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators
LaLumondiere, SD
Koga, R
Yu, P
Maher, MC
Moss, SC
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (06) : 3121 - 3128
[4] High-precision single-event transient hardened comparator with the sensitive node transient detection feedback latch technique
Xie, Yuqiao
Xu, Tao
Liu, Zhongyang
Qiu, Guoji
Bi, Dawei
Hu, Zhiyuan
Zhang, Zhengxuan
Zou, Shichang
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 2024,

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