Surface modification of SiC substrates via direct fluorination to promote adhesion of electroless-deposited Ni film

被引:0
作者
Namie, Masanari [1 ]
Nishimura, Fumihiro [2 ]
Kim, Jae-Ho [1 ]
Yonezawa, Susumu [2 ]
机构
[1] Univ Fukui, Fac Engn, Dept Mat Sci & Engn, 3-9-1 Bunkyo, Fukui 9108507, Japan
[2] Univ Fukui, Cooperat Res Ctr, Fukui, Japan
关键词
Surface fluorination; Silicon carbide; Adhesion; Electroless metal plating; COPPER DEPOSITION; SILICON; SPECTROSCOPY; PARTICLES; CHEMISTRY; ENERGY; ACID;
D O I
10.1016/j.jfluchem.2022.110012
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
To improve the adhesion between a silicon carbide (SiC) substrate and an electroless-plated Ni film, this study focused on the modification of a SiC substrate via direct fluorination (using F-2 gas) at 100-300 ? and 380 Torr for 10-120 min. During fluorination, the surface topography of the samples changed markedly at temperatures > 200 ?. However, the SiC surface fluorinated at 200 ? adhered poorly to the electroless-plated Ni films because of the formation of hydrophobic layers such as those comprising CF2 and CF3 groups. At temperatures greater than 300 ?, CF4 gasification of hydrophobic groups occurred on the SiC surface. This resulted in a SiC substrate with high surface roughness and hydrophilicity that strongly adhered to an electroless-plated Ni film. When the reaction temperature was 300 ? and the reaction time was 30 min or longer, the plating adhered strongly to the substrate. The adhesion strength between the SiC substrate and the electroless-deposited Ni film could be enhanced by hydrophilizing and roughening the SiC substrate through direct fluorination with F-2.
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页数:11
相关论文
共 35 条
[1]  
ASTM, 2002, ASTM D3359-02
[2]   Electroless Ni-B and composite coatings: A critical review on formation mechanism, properties, applications and future trends [J].
Barati, Q. ;
Hadavi, Seyed Mohammad Mehdi .
SURFACES AND INTERFACES, 2020, 21
[3]  
Chen JR, 1997, J APPL POLYM SCI, V63, P1733
[5]   FTIR SPECTROSCOPY FOR THE ANALYSIS OF SELECTED EXHAUST-GAS FLOWS IN SILICON TECHNOLOGY [J].
GUBER, AE ;
KOHLER, U .
JOURNAL OF MOLECULAR STRUCTURE, 1995, 348 :209-212
[6]   Electroless copper deposition for ultralarge-scale integration [J].
Hsu, HH ;
Lin, KH ;
Lin, SJ ;
Yeh, JW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2001, 148 (01) :C47-C53
[7]   Photoinduced Hydrodefluorination Mechanisms of Perfluorooctanoic Acid by the SiC/Graphene Catalyst [J].
Huang, Dahong ;
Yin, Lifeng ;
Niu, Junfeng .
ENVIRONMENTAL SCIENCE & TECHNOLOGY, 2016, 50 (11) :5857-5863
[8]   Nanotubes in microwave fields: Light emission, intense heat, outgassing, and reconstruction [J].
Imholt, TJ ;
Dyke, CA ;
Hasslacher, B ;
Perez, JM ;
Price, DW ;
Roberts, JA ;
Scott, JB ;
Wadhawan, A ;
Ye, Z ;
Tour, JM .
CHEMISTRY OF MATERIALS, 2003, 15 (21) :3969-3970
[9]   Surface Wettability of Oxygen Plasma Treated Porous Silicon [J].
Jiang, Lei ;
Li, Songyan ;
Wang, Jiqian ;
Yang, Limin ;
Sun, Qian ;
Li, Zhaomin .
JOURNAL OF NANOMATERIALS, 2014, 2014
[10]   An in situ IR study of the thermal decomposition of trifluoroacetic acid [J].
Jollie, DM ;
Harrison, PG .
JOURNAL OF THE CHEMICAL SOCIETY-PERKIN TRANSACTIONS 2, 1997, (08) :1571-1575