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3-D diffuse object profilometry based on analysis the intensity of grating pattern
被引：0
作者：
Hu, ZF
Luo, CL
Zhou, JQ
机构：
来源：
INTERNATIONAL CONFERENCE ON HOLOGRAPHY AND OPTICAL INFORMATION PROCESSING (ICHOIP '96)
|
1996年
/
2866卷
关键词：
profilometry;
grating;
phase measurement;
moire;
D O I：
10.1117/12.263029
中图分类号：
TM [电工技术];
TN [电子技术、通信技术];
学科分类号：
0808 ;
0809 ;
摘要：
By analyzing the intensity of grating pattern we investigated a technique for automatic 3-D shape measurement. Phase reduction is based on analyzing the intensity of the grating pattern which is produced by divergent illumination. Only one image pattern is sufficient and the technique is very simple. It has the nature of fast and accurate. The paper present theoretical simulation and experimental results.
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页码：493 / 496
页数：4
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