A fast locking and low jitter delay-locked loop using DHDL

被引:13
|
作者
Chang, HH [1 ]
Lin, JW
Liu, SI
机构
[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 10617, Taiwan
[2] Natl Taiwan Univ, Grad Inst Elect Engn, Taipei 10617, Taiwan
关键词
CMOS; delay-locked loops; fast locking; low jitter;
D O I
10.1109/JSSC.2002.807399
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A fast-locking and low-jitter delay-locked loop (DLL) using the digital-controlled half-replica delay line (DHDL) is presented. The DHDL can provide stable bias voltage for the charge-pump circuit to achieve low-jitter performances; meanwhile, the property of bandwidth tracking can still be preserved. It can also provide a larger pumping current to reduce the lock time in the initialization state and provide a smaller current to improve jitter performance in the locked state. For comparisons, both the proposed DLL and the self-biased DLL have been fabricated in a 0.35-mum one-poly four-metal CMOS process. From the measurement results, the proposed DLL has a shorter lock time and a better jitter performance than the self-biased DLL. The root-mean-squared jitter and peak-to-peak jitter are less than, 4.2 and 30 ps, respectively, occurring at 75 MHz, over an operating frequency range of 50-150 MHz.
引用
收藏
页码:343 / 346
页数:4
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