On the circuit and VLSI complexity of threshold gate COMPARISON

被引:14
|
作者
Beiu, V [1 ]
机构
[1] Univ Calif Los Alamos Natl Lab, Div NIS 1, Los Alamos, NM 87545 USA
关键词
area-time complexity; circuit complexity; COMPARISON; threshold gates/circuits; VLSI complexity;
D O I
10.1016/S0925-2312(97)00099-4
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The paper overviews recent developments concerning optimal (from the point of view of size and depth) implementations of COMPARISON using threshold gates. We detail a class of solutions which also covers other particular solutions, and spans from constant to logarithmic depths. These theoretical circuit complexity results are extended to VLSI complexity ones, having practical applications to: (i) hardware implementations of integrated circuits; (ii) VLSI-friendly neural learning algorithms (i.e., constructive, or ontogenetic algorithms); and (iii) synthesis methods for mixed digital/analog technologies. In order to estimate the area (A) and the delay (T), as well as the classical AT(2), we make use of the following "cost functions": (i) the connectivity (i.e., sum of fan-ins) and the number-of-bits for representing the weights and thresholds are used as closer approximations of the area; while (ii) the fan-ins and the length of the wires are used for closer estimates of the delay. Such approximations will allow us to compare several solutions - which present very interesting fan-in-dependent depth-size and area-delay tradeoffs - with respect to AT(2). (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:77 / 98
页数:22
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