Modelling of dielectric cavity structures using multiresolution time-domain analysis

被引：0
|
作者：
Robertson, R [1 ]
Tentzeris, E [1 ]
Krumpholz, M [1 ]
Katehi, LPB [1 ]
机构：
[1] Univ Michigan, Dept Elect Engn & Comp Sci, Radiat Lab, Ann Arbor, MI 48109 USA
来源：
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS | 1998年 / 11卷 / 01期
关键词：
D O I：
10.1002/(SICI)1099-1204(199801/02)11:1<55::AID-JNM289>3.3.CO;2-T
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Multiresolution time domain (MRTD) analysis is applied directly to Maxwell's equations to model inhomogeneous dielectric material. In our approach, scaling and wavelet functions are used as a complete basis for the method of moments. The MRTD scheme is used to analyze different types of resonant cavity structures with varying dielectric perturbations in one, two and three dimensions. The results presented here agree very well with those obtained by FDTD, FEM and integral equation methods. MRTD allows for considerable savings in memory and computation time in comparison to FDTD, while maintaining the same accuracy of the results. (C) 1998 John Wiley & Sons, Ltd.
引用
收藏
页码：55 / 68
页数：14
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