Synchrotron X-ray diffraction observation of phase transformation during annealing of Si processed by high-pressure torsion

被引:13
作者
Ikoma, Yoshifumi [1 ]
Yamasaki, Terumasa [1 ]
Masuda, Takahiro [1 ,2 ]
Tange, Yoshinori [3 ]
Higo, Yuji [3 ]
Ohishi, Yasuo [3 ]
McCartney, Martha R. [4 ]
Smith, David J. [4 ]
Horita, Zenji [1 ,5 ,6 ,7 ]
机构
[1] Kyushu Univ, Dept Mat Sci & Engn, Fukuoka 8190395, Japan
[2] Yokohama Natl Univ, Dept Mech Engn & Mat Sci, Yokohama, Kanagawa, Japan
[3] Japan Synchrotron Radiat Res Inst JASRI, Sayo, Hyogo, Japan
[4] Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA
[5] Kyushu Inst Technol, Grad Sch Engn, Kitakyushu, Fukuoka, Japan
[6] Kumamoto Univ, Magnesium Res Ctr, Kumamoto, Japan
[7] Saga Univ, Synchrotron Light Applicat Ctr, Saga, Japan
基金
日本学术振兴会;
关键词
Severe plastic deformation; semiconductors; metastable phases; phase transformation; synchrotron radiation; PHOTOCATALYTIC PROPERTIES; NANOGRAINED SILICON; METASTABLE PHASES; TRANSITIONS; GERMANIUM;
D O I
10.1080/09500839.2021.1905192
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In situ observation of a phase transformation during annealing of Si containing diamond-cubic (dc) and metastable phases has been performed using synchrotron X-ray diffraction. Metastable body-centred-cubic (bc8) and rhombohedral (r8) phases were formed by high-pressure torsion. These metastable phases gradually disappeared when increasing the annealing temperature to similar to 180 degrees C while another metastable phase having a hexagonal diamond (hd) structure appeared at similar to 190 degrees C. High-resolution transmission microscopy analysis revealed that hd and dc grains were present after annealing at 200 degrees C. The results indicate that a phase transformation, mainly from bc8 to hd, occurred during annealing.
引用
收藏
页码:223 / 231
页数:9
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