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Synchrotron X-ray diffraction observation of phase transformation during annealing of Si processed by high-pressure torsion
被引:13
作者:
Ikoma, Yoshifumi
[1
]
Yamasaki, Terumasa
[1
]
Masuda, Takahiro
[1
,2
]
Tange, Yoshinori
[3
]
Higo, Yuji
[3
]
Ohishi, Yasuo
[3
]
McCartney, Martha R.
[4
]
Smith, David J.
[4
]
Horita, Zenji
[1
,5
,6
,7
]
机构:
[1] Kyushu Univ, Dept Mat Sci & Engn, Fukuoka 8190395, Japan
[2] Yokohama Natl Univ, Dept Mech Engn & Mat Sci, Yokohama, Kanagawa, Japan
[3] Japan Synchrotron Radiat Res Inst JASRI, Sayo, Hyogo, Japan
[4] Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA
[5] Kyushu Inst Technol, Grad Sch Engn, Kitakyushu, Fukuoka, Japan
[6] Kumamoto Univ, Magnesium Res Ctr, Kumamoto, Japan
[7] Saga Univ, Synchrotron Light Applicat Ctr, Saga, Japan
基金:
日本学术振兴会;
关键词:
Severe plastic deformation;
semiconductors;
metastable phases;
phase transformation;
synchrotron radiation;
PHOTOCATALYTIC PROPERTIES;
NANOGRAINED SILICON;
METASTABLE PHASES;
TRANSITIONS;
GERMANIUM;
D O I:
10.1080/09500839.2021.1905192
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
In situ observation of a phase transformation during annealing of Si containing diamond-cubic (dc) and metastable phases has been performed using synchrotron X-ray diffraction. Metastable body-centred-cubic (bc8) and rhombohedral (r8) phases were formed by high-pressure torsion. These metastable phases gradually disappeared when increasing the annealing temperature to similar to 180 degrees C while another metastable phase having a hexagonal diamond (hd) structure appeared at similar to 190 degrees C. High-resolution transmission microscopy analysis revealed that hd and dc grains were present after annealing at 200 degrees C. The results indicate that a phase transformation, mainly from bc8 to hd, occurred during annealing.
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页码:223 / 231
页数:9
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