Selective growth of uniform single-layer graphene on Cu foil and fabrication of damage-free field effect transistor combining with direct transfer
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Park, Seulgi
[1
]
Park, Hyunjin
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Korea Res Inst Chem Technol, Adv Mat Div, 141 Gajeong Ro, Daejeon 34114, South KoreaPohang Univ Sci & Technol, Dept Elect Engn, 77 Cheongam Ro, Pohang Si 37673, Gyeongsangbuk D, South Korea
Park, Hyunjin
[2
]
Choi, YoungMoon
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Samsung Elect, Semicond R&D Ctr, 1 Samsungjeonja Ro, Hwaseong Si 18448, Gyeonggi Do, South KoreaPohang Univ Sci & Technol, Dept Elect Engn, 77 Cheongam Ro, Pohang Si 37673, Gyeongsangbuk D, South Korea
Choi, YoungMoon
[3
]
Kim, Ohyun
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Pohang Univ Sci & Technol, Dept Elect Engn, 77 Cheongam Ro, Pohang Si 37673, Gyeongsangbuk D, South KoreaPohang Univ Sci & Technol, Dept Elect Engn, 77 Cheongam Ro, Pohang Si 37673, Gyeongsangbuk D, South Korea
Kim, Ohyun
[1
]
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[1] Pohang Univ Sci & Technol, Dept Elect Engn, 77 Cheongam Ro, Pohang Si 37673, Gyeongsangbuk D, South Korea
[2] Korea Res Inst Chem Technol, Adv Mat Div, 141 Gajeong Ro, Daejeon 34114, South Korea
[3] Samsung Elect, Semicond R&D Ctr, 1 Samsungjeonja Ro, Hwaseong Si 18448, Gyeonggi Do, South Korea
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
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2019年
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37卷
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04期
During selective growth of graphene by using silicon dioxide (SiO2) patterns on Cu foil (SOCF), multilayer graphene was grown on SOCF under the same conditions that are used to synthesize single-layer graphene (SLG) on blank Cu foil. The authors demonstrated that oxygen (O-2) species that can be released from the SiO2 film did not affect the layer increase and that the SiO2 film of SOCF reduced the area of the exposed Cu surface and thereby increased the relative concentration of hydrogen (H-2) to the Cu surface and initially grown graphene; as a result, extra graphene layers grew on SOCF. By adjusting the H-2 supply and SiO2 coverage, uniformly-grown SLG patterns were obtained on SOCF. A damage-free graphene field effect transistor (GFET) was fabricated using selectively-grown SLG and direct transfer using parylene-C. The field effect mobility of the GFET was 7538.81 cm2/(V s), which is quite high compared to those of chemical vapor deposition based GFETs on flexible substrates that have been reported. (c) 2019 Author(s).
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Univ Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
Univ Salerno, Ctr Interdipartimentale NANO MATES, I-84084 Fisciano, SA, Italy
CNR SPIN Salerno, I-84084 Fisciano, SA, ItalyUniv Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
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Univ Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
Univ Salerno, Ctr Interdipartimentale NANO MATES, I-84084 Fisciano, SA, Italy
CNR SPIN Salerno, I-84084 Fisciano, SA, ItalyUniv Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
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Citro, Roberta
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IHP, D-15236 Frankfurt, Oder, GermanyUniv Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
Schroeder, Thomas
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IHP, D-15236 Frankfurt, Oder, GermanyUniv Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
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Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, EnglandUniv Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England
机构:
Univ Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
Univ Salerno, Ctr Interdipartimentale NANO MATES, I-84084 Fisciano, SA, Italy
CNR SPIN Salerno, I-84084 Fisciano, SA, ItalyUniv Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
Giubileo, Filippo
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Santandrea, Salvatore
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Univ Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
Univ Salerno, Ctr Interdipartimentale NANO MATES, I-84084 Fisciano, SA, Italy
CNR SPIN Salerno, I-84084 Fisciano, SA, ItalyUniv Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
Santandrea, Salvatore
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Romeo, Francesco
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Citro, Roberta
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Schroeder, Thomas
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IHP, D-15236 Frankfurt, Oder, GermanyUniv Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
Schroeder, Thomas
;
Lupina, Grzegorz
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IHP, D-15236 Frankfurt, Oder, GermanyUniv Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, SA, Italy
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Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, EnglandUniv Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England
Geim, A. K.
;
Novoselov, K. S.
论文数: 0引用数: 0
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Univ Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, EnglandUniv Manchester, Manchester Ctr Mesosci & Nanotechnol, Manchester M13 9PL, Lancs, England